DocumentCode
2591104
Title
VLSI manufacturing in Japan and the United States
Author
Hodges, David A.
Author_Institution
Coll. of Eng., California Univ., Berkeley, CA, USA
fYear
1990
fDate
11-12 Sep 1990
Firstpage
1
Lastpage
2
Abstract
Very-large-scale integration (VLSI) manufacturing techniques in Japan are compared with those in the United States. Factory design, employment practices, random vs. causal yield fluctuations, process control and productivity, and computer integrated manufacturing (CIM) systems are discussed
Keywords
CAD/CAM; VLSI; integrated circuit manufacture; manufacturing computer control; manufacturing data processing; CIM systems; Japan; United States; VLSI manufacturing; computer integrated manufacturing; employment practices; factory design; process control; productivity; yield fluctuations; Assembly; Fabrication; Incentive schemes; Manufacturing automation; Process control; Production facilities; Productivity; Semiconductor device manufacture; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1990. ASMC 90 Proceedings. IEEE/SEMI 1990
Conference_Location
Danvers, MA
Type
conf
DOI
10.1109/ASMC.1990.111211
Filename
111211
Link To Document