• DocumentCode
    2591166
  • Title

    Eliminating structure and intensity misalignment in image stitching

  • Author

    Jia, Jiaya ; Tang, Chi-Keung

  • Author_Institution
    Chinese Univ. of Hong Kong
  • Volume
    2
  • fYear
    2005
  • fDate
    17-21 Oct. 2005
  • Firstpage
    1651
  • Abstract
    The aim of this paper is to achieve seamless image stitching for eliminating obvious visual artifact caused by severe intensity discrepancy, image distortion and structure misalignment, given that the input images are globally registered. Our approach is based on structure deformation and propagation while maintaining the overall appearance affinity of the result to the input images. This new approach is proven to be effective in solving the above problems, and has found applications in mosaic deghosting, image blending and intensity correction. Our new method consists of the following main processes. First, salient features or structures are robustly detected and aligned along the optimal partitioning boundary between the input images. From these features, we derive sparse deformation vectors to to uniformly encode the underlying structure and intensity misalignment. These sparse deformation cues will then be propagated robustly and smoothly into the interior of the target image by solving the associated Laplace equations in the image gradient domain. We present convincing results to show that our method can handle significant structure and intensity misalignment in image stitching
  • Keywords
    Laplace equations; image denoising; image restoration; Laplace equations; image blending; image distortion; image gradient; intensity correction; intensity misalignment elimination; mosaic deghosting; salient features; seamless image stitching; structure misalignment elimination; Computer vision; Councils; Image generation; Image registration; Laplace equations; Pattern matching; Robustness; Videoconference;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision, 2005. ICCV 2005. Tenth IEEE International Conference on
  • Conference_Location
    Beijing
  • ISSN
    1550-5499
  • Print_ISBN
    0-7695-2334-X
  • Type

    conf

  • DOI
    10.1109/ICCV.2005.87
  • Filename
    1544915