• DocumentCode
    2592780
  • Title

    Using X-parameters to model diode-based RF power probes

  • Author

    Boaventura, A.S. ; Testera, A.R. ; Carvalho, Nuno Borges ; Barciela, M.F.

  • Author_Institution
    Universidade de Aveiro, Portugal
  • fYear
    2011
  • fDate
    5-10 June 2011
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given, as follows. This paper presents an X-parameter model for diode power probes that can be used for calibration purposes. It will be shown that X-parameters can be applied to diode power probes with significant gains in terms of behavior characterization. This first tentative to apply X-parameters is a step further in the calibration of power probes, when they are excited by modulated signals.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-61284-754-2
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2011.5973230
  • Filename
    5973230
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2592780