DocumentCode
2593268
Title
Integration Of Comprehensive Testing In Microelectronics Curriculum
Author
Prasad, Prof Kanti ; Goel, Prof Aditya
Author_Institution
University of Massachusetts
fYear
1994
fDate
30 Jun-1 Jul 1994
Keywords
Chemistry; Circuit testing; Computer science education; Educational institutions; Fabrication; Microelectronics; P-n junctions; Packaging; Physics education; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
Type
conf
DOI
10.1109/ATW.1994.747839
Filename
747839
Link To Document