DocumentCode
2593297
Title
New Testability Measures For High Level Description Of Circuits
Author
Gentil, M.-H. ; Crestani, D. ; Rhalibi, A.E. ; Durante, C.
fYear
1994
fDate
30 Jun-1 Jul 1994
Keywords
Area measurement; Circuit analysis; Circuit faults; Circuit testing; Controllability; Information theory; Logic circuits; Logic testing; Observability; Pollution measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop, 1994. ATW '94. The Third Annual Atlantic
Type
conf
DOI
10.1109/ATW.1994.747842
Filename
747842
Link To Document