• DocumentCode
    2593975
  • Title

    Partial Discharge Resistant Aging Mechanism of Nanocomposite Enamel Wires under Repetitive Surge Voltage Condition

  • Author

    Nakamura, Yusuke ; Inano, H. ; Hiroshima, Satoshi ; Hirose, Tatsuya ; Hamaguchi, Masahiro ; Okubo, Hitoshi

  • Author_Institution
    Nagoya Univ., Nagoya
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    375
  • Lastpage
    378
  • Abstract
    This paper discusses the partial discharge (PD) resistant mechanism of nanocomposite enamel wires under repetitive surge voltage condition for inverter-fed motors. We focused on the reduction of deterioration depth and the surface condition of nanocomposite enamel wires after repetitive surge voltage application with successive PD. Experimental results revealed that the longer lifetime of breakdown of nanocomposite enamel wires compared with the conventional wires would be brought about not only by the filled nano materials, but also by their byproduct on the enamel surface under repetitive PD generation. The erosion of nanocomposite enamel layers was suppressed in depth by the byproduct and dispersed in the longitudinal direction along the enamel surface, which could contribute to the longer lifetime of breakdown than conventional wires.
  • Keywords
    AC motors; ageing; enamels; filled polymers; insulated wires; insulation testing; nanocomposites; partial discharge measurement; surges; PD measurement; breakdown lifetime; insulation deterioration depth; inverter-fed motors; nanocomposite enamel wire; partial discharge resistant aging mechanism; surface erosion; surge voltage condition; Aging; Breakdown voltage; Dielectrics and electrical insulation; Micromotors; Partial discharges; Pulse measurements; Resistance; Surge protection; Testing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
  • Conference_Location
    Quebec, QC
  • Print_ISBN
    978-1-4244-2548-8
  • Electronic_ISBN
    978-1-4244-2549-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2008.4772764
  • Filename
    4772764