• DocumentCode
    2595634
  • Title

    Susceptibility analysis of wideband RF receiving channel in the presence of an electromagnetic pulse (EMP)

  • Author

    Jing Jin ; Meng-Lin Zhai ; Wen-Yan Yin

  • Author_Institution
    Zhejiang Provincial Key Lab. for Sensing Technol., Zhejiang Univ., Hangzhou, China
  • fYear
    2012
  • fDate
    21-24 May 2012
  • Firstpage
    433
  • Lastpage
    436
  • Abstract
    Susceptibility analysis of wideband RF receiving channel in the presence of an electromagnetic pulse (EMP) is carried out in this paper. It mainly consists of antenna, limiter, filter, low noise amplifier (LNA), sensitivity control component, and power amplifier (PA), etc. Certain breakdown of the LNA under the impact of an EMP is demonstrated experimentally with different pulse widths, where its first-stage MESFET is damaged clearly. The output responses of the RF channel are simulated using the commercial software ADS for two types of EMP waveforms, respectively. It is evident that the channel performance is degraded seriously, due to the existence of the EMP. Under such circumstances, some special techniques for an effectively protecting the RF channel should be further employed.
  • Keywords
    Schottky gate field effect transistors; electromagnetic pulse; low noise amplifiers; microwave field effect transistors; microwave power amplifiers; wireless channels; EMP waveforms; LNA; PA; electromagnetic pulse; first-stage MESFET; low noise amplifier; power amplifier; sensitivity control component; susceptibility analysis; wide band RF receiving channel; Electromagnetics; Integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1557-0
  • Electronic_ISBN
    978-1-4577-1558-7
  • Type

    conf

  • DOI
    10.1109/APEMC.2012.6237976
  • Filename
    6237976