DocumentCode
2595634
Title
Susceptibility analysis of wideband RF receiving channel in the presence of an electromagnetic pulse (EMP)
Author
Jing Jin ; Meng-Lin Zhai ; Wen-Yan Yin
Author_Institution
Zhejiang Provincial Key Lab. for Sensing Technol., Zhejiang Univ., Hangzhou, China
fYear
2012
fDate
21-24 May 2012
Firstpage
433
Lastpage
436
Abstract
Susceptibility analysis of wideband RF receiving channel in the presence of an electromagnetic pulse (EMP) is carried out in this paper. It mainly consists of antenna, limiter, filter, low noise amplifier (LNA), sensitivity control component, and power amplifier (PA), etc. Certain breakdown of the LNA under the impact of an EMP is demonstrated experimentally with different pulse widths, where its first-stage MESFET is damaged clearly. The output responses of the RF channel are simulated using the commercial software ADS for two types of EMP waveforms, respectively. It is evident that the channel performance is degraded seriously, due to the existence of the EMP. Under such circumstances, some special techniques for an effectively protecting the RF channel should be further employed.
Keywords
Schottky gate field effect transistors; electromagnetic pulse; low noise amplifiers; microwave field effect transistors; microwave power amplifiers; wireless channels; EMP waveforms; LNA; PA; electromagnetic pulse; first-stage MESFET; low noise amplifier; power amplifier; sensitivity control component; susceptibility analysis; wide band RF receiving channel; Electromagnetics; Integrated circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location
Singapore
Print_ISBN
978-1-4577-1557-0
Electronic_ISBN
978-1-4577-1558-7
Type
conf
DOI
10.1109/APEMC.2012.6237976
Filename
6237976
Link To Document