• DocumentCode
    2596050
  • Title

    Prediction of PD Magnitudes using Three-Dimensional Finite Element Analysis

  • Author

    Guo, Jim Jun ; Boggs, Steve ; Campbell, Thomas

  • Author_Institution
    Inst. of Mater. Sci., Univ. of Connecticut, Storrs, CT
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    443
  • Lastpage
    446
  • Abstract
    The use of 2D finite element analysis (FEA) to predict PD magnitudes for ellipsoidal and spheroidal cavities has been demonstrated for well over a decade. However the introduction of an arbitrary defect, such as a track along an interface, converts even an axisymmetric 2D geometry to 3D, and prediction of PD from such arbitrary defects was not possible prior to the practicability of routine 3D FEA. We have used 3D finite element analysis to model a separable connector with a track along various interfaces, which facilitates computation of the PD magnitude as a function of track length and position along the interface. The PD magnitude is estimated by calculating the change in capacitance which occurs when the defect goes from nonconducting to conducting and multiplying by the partial discharge extinction voltage. Our predictions on this basis are in good agreement with measurements.
  • Keywords
    finite element analysis; partial discharge measurement; FEA; PD magnitude prediction; capacitance change; ellipsoidal cavities; partial discharge extinction voltage; spheroidal cavities; three-dimensional finite element analysis; Capacitance; Connectors; Dielectrics; Finite element methods; Geometry; Insulation life; Insulators; Partial discharges; Power cables; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on
  • Conference_Location
    Quebec, QC
  • Print_ISBN
    978-1-4244-2548-8
  • Electronic_ISBN
    978-1-4244-2549-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.2008.4772894
  • Filename
    4772894