• DocumentCode
    2597139
  • Title

    Hydrodynamic Simulation Of P-n Junctions In The Breakdown Regime

  • Author

    Quade, W. ; Rudan, M.

  • Author_Institution
    Universita di Blologna
  • fYear
    1990
  • fDate
    3-4 Jun 1990
  • Firstpage
    45
  • Lastpage
    46
  • Keywords
    Electric breakdown; Electrons; Equations; Hot carrier effects; Hot carriers; Hydrodynamics; Impact ionization; Independent component analysis; P-n junctions; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
  • Type

    conf

  • DOI
    10.1109/NUPAD.1990.748269
  • Filename
    748269
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2597139