• DocumentCode
    2597235
  • Title

    Saturn - A Device Engineer´s Tool For Optimizing Mosfet Performance And Lifetime

  • Author

    Jacobs, H. ; Hinsch, W. ; Hofmann, F. ; Jacobs, W. ; Paffrath, M. ; Rank, E. ; Steger, K. ; Weinert, U.

  • Author_Institution
    Silicon Process Technology
  • fYear
    1990
  • fDate
    3-4 Jun 1990
  • Firstpage
    55
  • Lastpage
    56
  • Keywords
    Circuit simulation; Design optimization; Doping profiles; Jacobian matrices; Leakage current; MOSFET circuits; Research and development; Saturn; Silicon; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Modeling of Processes and Devices for Integrated Circuits, 1990. NUPAD III. 1990 Workshop on
  • Type

    conf

  • DOI
    10.1109/NUPAD.1990.748274
  • Filename
    748274