Prediction of Functional Electronic Block Performance Through Localization of Malfunctions

Author

Lytle, W.J. ; Merck, J.W. ; Dzimianski, J.W. ; Skinner, S.M.

Author_Institution

Air Arm Division, Westinghouse Electric Corporation, Baltimore 3, Maryland

fYear

1963

fDate

Sept. 1963

Firstpage

226

Lastpage

244

Keywords

Contacts; Copper; Diodes; Fabrication; Geometry; Manufacturing; Microelectronics; Probes; Slabs; Solid state circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1963. Second Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

DOI

10.1109/IRPS.1963.362248

Filename

4207599

Link To Document