• DocumentCode
    2598854
  • Title

    A Reliability Predictor for Semiconductor Devices

  • Author

    Chamow, Martin F.

  • Author_Institution
    General Electric Company, Re-entry Systems Department, Missile and Space Division, P.O. Box 8555, Philadelphia 1, Pa.
  • fYear
    1964
  • fDate
    Sept. 1964
  • Firstpage
    210
  • Lastpage
    237
  • Keywords
    Aerospace electronics; Manufacturing processes; Missiles; Production; Semiconductor device reliability; Semiconductor devices; Space missions; Temperature; Testing; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physics of Failure in Electronics, 1964. Third Annual Symposium on the
  • Conference_Location
    Chicago, IL, USA
  • ISSN
    0097-2088
  • Type

    conf

  • DOI
    10.1109/IRPS.1964.362289
  • Filename
    4207643
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2598854