DocumentCode
2599678
Title
Looping behaviour of gold ballbonding wire
Author
Saraswati ; Theint, Ei Phyu Phyu ; Stephan, D. ; Wulff, F.W. ; Breach, C.D. ; Calpito, D.R.M.
Author_Institution
Mater. & Applications Centre, Kulicke & Soffa (S.E.A.) Pte. Ltd, Singapore, Singapore
fYear
2004
fDate
8-10 Dec. 2004
Firstpage
723
Lastpage
728
Abstract
Gold ballbonding is an enabling technology in electronics packaging that accounts for around 90% of the world demand for packaged IC´s. Thinner IC packaging demands lower wire loops and the stacked dies used for example in mobile telecommunications applications require a range of loop heights from very high to very low. In addition, multi-tier wirebonding also demands ultra low loop profile for its application. The lowest achievable loop heights are physically constrained by the wire dimensions and the plastic deformation behaviour of the wire. Ultra low loops result in extensive plastic deformation in the heat affected zone (HAZ). This paper examines the correlation between the wire properties (break load, modulus, hardness, grain size, HAZ length) and looping performance. The springback height of the lifted ball due to tension in the wire from bonding, and how it affects the looping behaviour is also discussed.
Keywords
electronics packaging; lead bonding; plasticity; IC packaging; electronics packaging; gold ballbonding wire; heat affected zone; loop heights; looping behaviour; multi-tier wirebonding; plastic deformation behaviour; stacked dies; ultra low loops; wire dimensions; wire loops; wire properties; Bonding; Electronics packaging; Gold; Grain size; Intermetallic; Mechanical factors; Neck; Plastic packaging; Stress; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2004. EPTC 2004. Proceedings of 6th
Print_ISBN
0-7803-8821-6
Type
conf
DOI
10.1109/EPTC.2004.1396702
Filename
1396702
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