Effective Screening of Integrated Circuits

A unique dc pin-to-pin test method for integrated circuits has been developed at the Goddard Space Flight Center. This test method permits each element in a circuit (resistor, diode, transistor, etc.) to be tested and evaluated individually rather than in combination, as is the case with the normally utilized integrated circuit functional testing technique. This dc pin-to-pin test method has been fully automated from testing to data analysis, making it a quick, economical and practical tool for integrated circuit testing, evaluation and/or screening.