DocumentCode
2600639
Title
The Impact of the Flight Specifications on Semiconductor Failure Rates
Author
Partridge, Jayne ; Hanley, L.David
Author_Institution
Instrumentation Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts
fYear
1967
fDate
Nov. 1967
Firstpage
20
Lastpage
30
Abstract
The procurement, screen and burn-in, and field history of the semiconductor parts in the Apollo Guidance Computer (AGC) is given. Both field failures and variability of performance through screen and burn-in are directly related to changes occurring in the parts manufacturer´s facilities. The problems of developing and sustaining high reliability are discussed.
Keywords
Circuit testing; History; Instruments; Integrated circuit reliability; Laboratories; Manufacturing processes; Military computing; Process control; Procurement; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1967. Sixth Annual
Conference_Location
Los Angeles, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1967.362390
Filename
4207753
Link To Document