DocumentCode

2600973

Title

Extending the Life of Chromium-Silver Metallization on Silicon Devices

Author

Ross, E.C. ; Wallmark, J.T.

Author_Institution

RCA Laboratories, Radio Corporation of America, Princeton, New Jersey

fYear

1967

fDate

Nov. 1967

Firstpage

160

Lastpage

165

Keywords

Chromium; Conductivity; Contact resistance; Electrical resistance measurement; Metallization; Ohmic contacts; Silicon devices; Silver; Strips; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1967. Sixth Annual

Conference_Location

Los Angeles, CA, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1967.362409

Filename

4207772