DocumentCode
2601575
Title
High performance Silicon-On-ONO (SOONO) Cell Array Transistors (SCATs) for 512Mb DRAM Cell Array Application
Author
Kim, Sung Hwan ; Bae, Hyun Jun ; Hong, Sung In ; Choi, Yong Lack ; Yoon, Eun Jung ; Song, Ho Ju ; Oh, Chang Woo ; Lee, Yong-Seok ; Cho, Hong ; Kim, Dong-Won ; Park, Donggun ; Lee, Won-Seong
Author_Institution
Samsung Electron. Co., Yongin
fYear
2007
fDate
10-12 Dec. 2007
Firstpage
35
Lastpage
38
Abstract
As DRAM cell pitch size scales, the DRAM cells have required characteristics of high performance transistors. In this paper, we proposed and successfully demonstrated high performance silicon-on-ONO (SOONO) cell array transistors (SCATs) for 512Mb DRAM cell array application. They have advantages of SOI substrate and 3-D hi-gate as well as process simplicity. From those advantages, they have low Ioff due to good SCE immunity with DIBL of 40 mV/V and SS of 84 mV/dec, low GIDL current, low junction leakage current, and low junction capacitance as well as no body bias dependence. Thus, the SCATs may be a promising solution satisfying the requirements of DRAM cells with scaling.
Keywords
DRAM chips; leakage currents; silicon-on-insulator; 3D hi gate; DRAM cell array application; SOI substrate; low junction capacitance; low junction leakage current; silicon on ONO cell array transistors; Capacitance; Character generation; Current measurement; Electric variables; FinFETs; Immune system; Leakage current; Random access memory; Scalability; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2007. IEDM 2007. IEEE International
Conference_Location
Washington, DC
Print_ISBN
978-1-4244-1507-6
Electronic_ISBN
978-1-4244-1508-3
Type
conf
DOI
10.1109/IEDM.2007.4418856
Filename
4418856
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