• DocumentCode
    2601575
  • Title

    High performance Silicon-On-ONO (SOONO) Cell Array Transistors (SCATs) for 512Mb DRAM Cell Array Application

  • Author

    Kim, Sung Hwan ; Bae, Hyun Jun ; Hong, Sung In ; Choi, Yong Lack ; Yoon, Eun Jung ; Song, Ho Ju ; Oh, Chang Woo ; Lee, Yong-Seok ; Cho, Hong ; Kim, Dong-Won ; Park, Donggun ; Lee, Won-Seong

  • Author_Institution
    Samsung Electron. Co., Yongin
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    35
  • Lastpage
    38
  • Abstract
    As DRAM cell pitch size scales, the DRAM cells have required characteristics of high performance transistors. In this paper, we proposed and successfully demonstrated high performance silicon-on-ONO (SOONO) cell array transistors (SCATs) for 512Mb DRAM cell array application. They have advantages of SOI substrate and 3-D hi-gate as well as process simplicity. From those advantages, they have low Ioff due to good SCE immunity with DIBL of 40 mV/V and SS of 84 mV/dec, low GIDL current, low junction leakage current, and low junction capacitance as well as no body bias dependence. Thus, the SCATs may be a promising solution satisfying the requirements of DRAM cells with scaling.
  • Keywords
    DRAM chips; leakage currents; silicon-on-insulator; 3D hi gate; DRAM cell array application; SOI substrate; low junction capacitance; low junction leakage current; silicon on ONO cell array transistors; Capacitance; Character generation; Current measurement; Electric variables; FinFETs; Immune system; Leakage current; Random access memory; Scalability; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2007. IEDM 2007. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    978-1-4244-1507-6
  • Electronic_ISBN
    978-1-4244-1508-3
  • Type

    conf

  • DOI
    10.1109/IEDM.2007.4418856
  • Filename
    4418856