Redundant transformations for BIST testability metrics-based data path allocation

In our previous works, we described a BIST testability metric-based high-level data path allocation algorithm to facilitate Built-In Self-Test (BIST) designs. In the present paper, we make use of two types of redundant transformations, which add redundancy that improves test resources to be shared in the data path, to improve our previous data path allocation algorithm. With a variety of benchmarks, we demonstrate the advantage of our approach compared with our previous and other conventional approaches.