DocumentCode

2602386

Title

Reliable Systems Operation of Amorphous Semiconductor Memories

Author

Nelson, D.L. ; Shanks, R.R. ; Vanlandingham, K.E. ; Helbers, J.H.

Author_Institution

Energy Conversion Devices, Troy, Michigan

fYear

1971

fDate

25993

Firstpage

40

Lastpage

40

Keywords

Amorphous semiconductors; Energy conversion; Semiconductor device reliability; Switches; Threshold voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1971. 9th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1971.362489

Filename

4207858