DocumentCode

2603213

Title

Degradation Analysis of Infrared and Visible Optoelectronics Devices

Author

Lebailly, J. ; Gouin, C. ; Desombre, A.

Author_Institution

R.T.C LA RADIOTECHNIQUE-COMPELEC, 14 -CAEN ( FRANCE )

fYear

1972

fDate

26390

Firstpage

126

Lastpage

136

Keywords

Aging; Capacitive sensors; Degradation; Diodes; Electroluminescence; Electroluminescent devices; Gallium arsenide; Gold; Optoelectronic devices; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1972. 10th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1972.362540

Filename

4207912