Advanced phase detection technique for the real time measurement and reduction of noise in components and oscillators

Author

McNeilage, C. ; Searls, J.H. ; Stockwell, P.R. ; Ivanov, E.N. ; Tobar, M.E. ; Woode, R.A.

Author_Institution

Poseidon Sci. Instrum. Pty. Ltd., Fremantle, WA, Australia

fYear

1997

fDate

28-30 May 1997

Firstpage

509

Lastpage

514

Abstract

A real time noise measurement technique has been developed which allows phase and amplitude noise measurements to be made with much higher sensitivity than previously possible. The technique is applicable at arbitrary operating frequency and can be used to measure the performance of wideband devices. The measurement system is based on an interferometer and a microwave implementation has been developed at X-band; using both connectorised `mechanical´ components and a microstrip module. This paper reports the results of the microstrip implementation as both a noise measurement system and as part of a frequency discriminator in ultra-low noise oscillators

Keywords

electric noise measurement; electromagnetic wave interferometry; electron device noise; microstrip components; microwave measurement; microwave oscillators; phase noise; real-time systems; X-band; advanced phase detection; carrier suppression interferometer; frequency discriminator; interferometer; mechanical components; microstrip implementation; microstrip module; microwave implementation; microwave oscillators; noise measurement; real time measurement; reduction of noise; ultra-low noise oscillators; Frequency measurement; Mechanical variables measurement; Microstrip components; Microwave devices; Microwave measurements; Microwave oscillators; Noise measurement; Phase detection; Phase measurement; Wideband;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International

Conference_Location

Orlando, FL

Print_ISBN

0-7803-3728-X

Type

conf

DOI

10.1109/FREQ.1997.638651

Filename

638651