DocumentCode
2604368
Title
Pulsed RF Life of an L-Band Power Transistor
Author
Fischer, Konrad H.
Author_Institution
Semiconductor Devices & Integrated Electronics Technical Area, US Army Electronics Technolog and Devices Laboratory (ECOM), Fort Monmouth, N.J. 07703
fYear
1973
fDate
26755
Firstpage
293
Lastpage
300
Abstract
An accelerated pulsed RF life study of the NSC-2010 L-band power transistor was started to determine suitability for an intended application. The application requires 12.5 W of output power at 1.4 GHz with a collector supply voltage of 28 V. During the study, the RF was pulsed with the pulse width being 1.5 ms, and the duty cycle 50%. Results available indicate that the median life and 0.01 percentile life of the transistor are both greater than the desired life of 1.2 X 106 hours at a junction temperature of 140°C and the electrical conditions indicated above. In addition, the predominant failure mode appears to be emitter-base shorting of the transistor due to the formation of a conductive path between the metalization and the silicon through the dielectric layer.
Keywords
Acceleration; Dielectrics; L-band; Power generation; Power transistors; Radio frequency; Silicon; Space vector pulse width modulation; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1973. 11th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1973.362610
Filename
4207985
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