• DocumentCode
    2604368
  • Title

    Pulsed RF Life of an L-Band Power Transistor

  • Author

    Fischer, Konrad H.

  • Author_Institution
    Semiconductor Devices & Integrated Electronics Technical Area, US Army Electronics Technolog and Devices Laboratory (ECOM), Fort Monmouth, N.J. 07703
  • fYear
    1973
  • fDate
    26755
  • Firstpage
    293
  • Lastpage
    300
  • Abstract
    An accelerated pulsed RF life study of the NSC-2010 L-band power transistor was started to determine suitability for an intended application. The application requires 12.5 W of output power at 1.4 GHz with a collector supply voltage of 28 V. During the study, the RF was pulsed with the pulse width being 1.5 ms, and the duty cycle 50%. Results available indicate that the median life and 0.01 percentile life of the transistor are both greater than the desired life of 1.2 X 106 hours at a junction temperature of 140°C and the electrical conditions indicated above. In addition, the predominant failure mode appears to be emitter-base shorting of the transistor due to the formation of a conductive path between the metalization and the silicon through the dielectric layer.
  • Keywords
    Acceleration; Dielectrics; L-band; Power generation; Power transistors; Radio frequency; Silicon; Space vector pulse width modulation; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1973. 11th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1973.362610
  • Filename
    4207985