DocumentCode
2604991
Title
TRIBuTE™ board and platform test methodology
Author
Nejedlo, Jay J.
Author_Institution
Enterprise Platforms Div., Intel Corp., Hillsboro, OR, USA
Volume
2
fYear
2003
fDate
30 Sept.-2 Oct. 2003
Firstpage
106
Abstract
Built-in-self-test (BIST) has been historically silicon-centric in its application. This paper offers an overview of Intel´s next generation platform test methodology, TRIBUTE™. TRIBUTE™ is an Intel coined acronym shorthand for Three-Reuseable-Integrated-Bist-u-TEchnologies. The TRIBuTE™ approach targets the replacement of today´s standard platform testing process and exploits BIST in a novel way....comprehensive board and platform testing.
Keywords
built-in self test; printed circuit testing; production testing; Intel; TRIBuTE; Three-Reuseable-Integrated-Bist-u-TEchnologies; board test; built-in-self-test; platform test methodology; standard platform testing process; Built-in self-test; Circuit faults; Circuit testing; Manufacturing processes; Operating systems; Printed circuits; Probes; Production facilities; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2003. Proceedings. ITC 2003. International
ISSN
1089-3539
Print_ISBN
0-7803-8106-8
Type
conf
DOI
10.1109/TEST.2003.1271200
Filename
1271200
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