DocumentCode

2605064

Title

Degradation Studies in GaAs .6P.4 Light-Emitting Diodes

Author

Weissman, R.H. ; Snyder, W.L. ; Ikari, G.T. ; Larsen, T.L.

Author_Institution

Hewlett-Packard Company, HPA Division, 640 Page Mill Rd., Palo Alto, CA 94304

fYear

1974

fDate

27120

Firstpage

273

Lastpage

277

Keywords

Copper; Degradation; Gallium arsenide; Light emitting diodes; Semiconductor diodes; Semiconductor materials; Substrates; Tellurium; Testing; Zinc;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1974. 12th Annual

Conference_Location

Las Vegas, NV, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1974.362657

Filename

4208035