DocumentCode
2605555
Title
Effects of Fast Temperature Cycling on Aluminum and Gold Metal Systems
Author
Macpherson, A.C. ; Weisenberger, W.H. ; Day, H.M. ; Christou, A.
Author_Institution
Naval Research Laboratory, Washington, D. C. 20375, (202) 767-2535
fYear
1975
fDate
27485
Firstpage
113
Lastpage
120
Abstract
Microwave power transistors in a radar-system may undergo ~ 1011 fast heating and cooling cycles during lifetime. Controlled temperature cycling tests have been carried out on Al, passivated Al, and gold metallization systems using both a special test pattern and commercially available transistors. Significant visible and electrical changes were observed for Al, glassed Al and a laboratory Ta-Pt-Ta-Au system, but not for a commercial gold transistor.
Keywords
Aluminum; Control systems; Cooling; Electromagnetic heating; Gold; Metallization; Microwave transistors; Power transistors; System testing; Temperature control;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1975. 13th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1975.362684
Filename
4208065
Link To Document