• DocumentCode
    2606502
  • Title

    Blind Image Steganalysis Based on Statistical Analysis of Empirical Matrix

  • Author

    Chen, Xiaochuan ; Wang, Yunhong ; Tan, Tieniu ; Guo, Lei

  • Author_Institution
    Inst. of Autom., Chinese Acad. of Sci., Beijing
  • Volume
    3
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    1107
  • Lastpage
    1110
  • Abstract
    In this paper, a novel steganalysis method based on statistical analysis of empirical matrix (EM) is proposed to detect the presence of hidden message in an image. The projection histogram (PH) of EM is used to extract features composed of two parts: the moments of PH and the moments of the characteristic function of PH. Also, features extracted from prediction-error image by Yun Q. Shi et al, (2005) are included to enhance performance. SVM is utilized as classifier. A test database is constructed, based on which a detailed test for different categories of features and a comparison with methods in prior arts are conducted. Experiments show that the features we proposed are more effective than prior arts and our steganalysis method could blindly detect the presence of data hiding for various embedding schemes with high performance
  • Keywords
    cryptography; data encapsulation; feature extraction; image classification; statistical analysis; support vector machines; SVM; blind image steganalysis; empirical matrix; feature extraction; hidden message; prediction-error image; projection histogram; statistical analysis; Art; Data encapsulation; Feature extraction; Histograms; Image databases; Spatial databases; Statistical analysis; Support vector machine classification; Support vector machines; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2006. ICPR 2006. 18th International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-2521-0
  • Type

    conf

  • DOI
    10.1109/ICPR.2006.332
  • Filename
    1699719