DocumentCode
2607501
Title
Compact modeling of anomalous high frequency behavior of MOSFET´s small-signal NQS parameters in presence of velocity saturation
Author
Roy, A.S. ; Sallese, J. -M ; Enz, C.C.
Author_Institution
Ecole Polytechnique Federale de Lausanne, Switzerland
fYear
2005
fDate
12-16 Sept. 2005
Firstpage
141
Lastpage
144
Abstract
In this work we present a physics based compact small-signal nonquasi static (NQS) model for MOST including velocity saturation and demonstrate that this can substantially change the behavior of the gate transadmittance (ydg) in saturation at high frequency. The magnitude of ydg starts to increase (instead of decreasing) after a certain frequency and its real part also starts to increase in negative direction instead of becoming zero. In addition, even for a long channel MOST, the weak inversion charge present at the drain can also effect the ydg in a similar way.
Keywords
MOSFET; semiconductor device models; MOSFET devices; anomalous high frequency behavior; compact small-signal nonquasi static model; gate transadmittance; long channel MOST device; small-signal NQS parameters; velocity saturation; weak inversion charge; Analytical models; Capacitance; Degradation; Frequency; Leg; MOSFET circuits; Physics; Predictive models; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
Print_ISBN
0-7803-9203-5
Type
conf
DOI
10.1109/ESSDER.2005.1546605
Filename
1546605
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