• DocumentCode
    2607501
  • Title

    Compact modeling of anomalous high frequency behavior of MOSFET´s small-signal NQS parameters in presence of velocity saturation

  • Author

    Roy, A.S. ; Sallese, J. -M ; Enz, C.C.

  • Author_Institution
    Ecole Polytechnique Federale de Lausanne, Switzerland
  • fYear
    2005
  • fDate
    12-16 Sept. 2005
  • Firstpage
    141
  • Lastpage
    144
  • Abstract
    In this work we present a physics based compact small-signal nonquasi static (NQS) model for MOST including velocity saturation and demonstrate that this can substantially change the behavior of the gate transadmittance (ydg) in saturation at high frequency. The magnitude of ydg starts to increase (instead of decreasing) after a certain frequency and its real part also starts to increase in negative direction instead of becoming zero. In addition, even for a long channel MOST, the weak inversion charge present at the drain can also effect the ydg in a similar way.
  • Keywords
    MOSFET; semiconductor device models; MOSFET devices; anomalous high frequency behavior; compact small-signal nonquasi static model; gate transadmittance; long channel MOST device; small-signal NQS parameters; velocity saturation; weak inversion charge; Analytical models; Capacitance; Degradation; Frequency; Leg; MOSFET circuits; Physics; Predictive models; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European
  • Print_ISBN
    0-7803-9203-5
  • Type

    conf

  • DOI
    10.1109/ESSDER.2005.1546605
  • Filename
    1546605