DocumentCode
2608778
Title
Simulation of Particle movement in a Single Phase Isolated Gas Insulated Busduct with Image Charge Effect
Author
Sahu, K. B Madhu ; Amarnath, J. ; Murthy, K. S Linga ; Singh, B.P.
Author_Institution
Aditya Inst. of Technol. & Manage., Tekkali
fYear
2008
fDate
9-12 Nov. 2008
Firstpage
466
Lastpage
469
Abstract
This work analyses with and without Image charge effect on metallic particle movement in a single phase GIB (Gas Insulated Busduct) and also with and without dielectric coating on the enclosure. Dielectric coating helps to improve the insulation performance. The enclosure in a GIB may be coated with a dielectric material to restore some of the dielectric strength of the compressed gas that is lost due to surface roughness and contamination with conducting particles. Under an applied AC voltage, the maximum height reached by particle in a GIB is much lower for a coated than for an uncoated enclosure. To obtain the particle trajectories, the equations describing the motion of the particle due to image charge effect has been developed in this paper. Further, the simulation has been carried out to obtain the particle trajectories at various voltages of Aluminium and Copper particles are presented and thoroughly discussed.
Keywords
dielectric materials; gas insulated substations; insulator contamination; GIB; conducting particles; dielectric coating; gas insulated substation; image charge effect; particle movement; single phase isolated gas insulated busduct; surface contamination; surface roughness; Coatings; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Gas insulation; Image analysis; Image restoration; Rough surfaces; Surface roughness; Voltage; Electrostatic effect; Gas Insulated Bus Duct; Gas insulated substations; Image charge effect; Metallic particles;
fLanguage
English
Publisher
ieee
Conference_Titel
High Voltage Engineering and Application, 2008. ICHVE 2008. International Conference on
Conference_Location
Chongqing
Print_ISBN
978-1-4244-3823-5
Electronic_ISBN
978-1-4244-2810-6
Type
conf
DOI
10.1109/ICHVE.2008.4773974
Filename
4773974
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