• DocumentCode
    2609039
  • Title

    Comparative study on solder joint reliability using different FE-models

  • Author

    Zhu, W.H. ; Stoeckl, S. ; Pape, H. ; Gan, S.L.

  • Author_Institution
    Assembly & Test, Infineon Technol. Asia Pacific Pte Ltd Corp, Singapore, Singapore
  • fYear
    2003
  • fDate
    10-12 Dec. 2003
  • Firstpage
    687
  • Lastpage
    694
  • Abstract
    Two finite-element-analysis (FEA) models, 3D-slice model and 1/8 or octant model, were used to simulate the solder joint reliability of ball grid array (BGA) packages. The solders were treated as Anand´s viscoplastic material and their fatigue life was estimated by Darveaux´s model. Simulation results are compared with some Weibull analysis results of the temperature cycling on board (TCOB) tests. It is confirmed that a big solder resist opening (SRO) and soft solder resist material greatly improves the fatigue life of solder joints. A good correlation of the first failure location between testing and simulation was found by cross-sectioning. Mostly the corner ball in the center matrix failed first. Besides, effects of voids in the solder balls are also discussed and analyzed.
  • Keywords
    ball grid arrays; fatigue; finite element analysis; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; resists; thermal stresses; viscoplasticity; voids (solid); 3D-slice model; Anand viscoplastic material; BGA; Darveaux model; TCOB; Weibull analysis; ball grid array packages; center matrix corner ball failure; finite-element-analysis; octant model; soft solder resist material; solder ball void effects; solder joint fatigue life; solder joint reliability; solder resist opening; temperature cycling; Analytical models; Electronics packaging; Fatigue; Field emitter arrays; Finite element methods; Life estimation; Resists; Soldering; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology, 2003 5th Conference (EPTC 2003)
  • Print_ISBN
    0-7803-8205-6
  • Type

    conf

  • DOI
    10.1109/EPTC.2003.1271607
  • Filename
    1271607