DocumentCode
2609504
Title
The Impact of Bubble Defects on Performance and Reliability
Author
Hsieh, W.J. ; Hsin, C.H. ; Chi, H.C. ; Chen, T.T.
Author_Institution
Rockwell International, Newport Beach, CA 92663, (714) 833-4079
fYear
1980
fDate
29312
Firstpage
77
Lastpage
77
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1980. 18th Annual
Conference_Location
Las Vegas, NV, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1980.362916
Filename
4208312
Link To Document