• DocumentCode
    2609504
  • Title

    The Impact of Bubble Defects on Performance and Reliability

  • Author

    Hsieh, W.J. ; Hsin, C.H. ; Chi, H.C. ; Chen, T.T.

  • Author_Institution
    Rockwell International, Newport Beach, CA 92663, (714) 833-4079
  • fYear
    1980
  • fDate
    29312
  • Firstpage
    77
  • Lastpage
    77
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1980. 18th Annual
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    0735-0791
  • Type

    conf

  • DOI
    10.1109/IRPS.1980.362916
  • Filename
    4208312