DocumentCode
2610113
Title
Compact and highly testable error indicator for self-checking circuits
Author
Metra, Cecilia ; Favalli, Michele ; Ricco, Bruno
Author_Institution
Dipt. di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
fYear
1996
fDate
6-8 Nov 1996
Firstpage
204
Lastpage
212
Abstract
A novel error indicator is proposed, which can be directly connected to the outputs of the checker of a self-checking circuit to memorize, until reset, the error indication possibly produced, independently of the successively given output words. The proposed error indicator features high on-line self-testing ability with respect to realistic faults, and a compact structure
Keywords
built-in self test; circuit testing; errors; compact structure; error indicator; on-line self-testing; self-checking circuit; Aerospace electronics; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Error correction; Fault detection; Fault tolerant systems; Latches;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1550-5774
Print_ISBN
0-8186-7545-4
Type
conf
DOI
10.1109/DFTVS.1996.572026
Filename
572026
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