• DocumentCode
    2610594
  • Title

    Reliable logic circuits with byte error control codes-a feasibility study

  • Author

    Lo, Jien-Chung ; Kitakami, Masato ; Fujiwara, Eiji

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
  • fYear
    1996
  • fDate
    6-8 Nov 1996
  • Firstpage
    286
  • Lastpage
    294
  • Abstract
    This paper addresses the relations between logic circuit synthesis, error model and error control codes so that the efficient reliable logic circuits can be obtained. We propose that single fault masking capability of a random logic circuit can be obtained by encoding its outputs in a byte error correcting code; this is equivalent to that of the triple module redundancy (TMR) technique. Similarly, byte error detecting code can be used to provide an equivalence of duplication. In this paper, we address the problems and issues related to the realization of byte-organized configuration where the byte error control codes can be applied. Some MCNC benchmark circuits are used as examples to demonstrate the feasibility of the proposed concept
  • Keywords
    circuit reliability; error correction codes; logic circuits; logic design; byte error control code; error model; random logic circuit synthesis; reliability; single fault masking; Adders; Circuit faults; Circuit synthesis; Computer errors; Error correction; Error correction codes; Fault detection; Fault tolerance; Hardware; Logic circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
  • Conference_Location
    Boston, MA
  • ISSN
    1550-5774
  • Print_ISBN
    0-8186-7545-4
  • Type

    conf

  • DOI
    10.1109/DFTVS.1996.572035
  • Filename
    572035