DocumentCode
2610594
Title
Reliable logic circuits with byte error control codes-a feasibility study
Author
Lo, Jien-Chung ; Kitakami, Masato ; Fujiwara, Eiji
Author_Institution
Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
fYear
1996
fDate
6-8 Nov 1996
Firstpage
286
Lastpage
294
Abstract
This paper addresses the relations between logic circuit synthesis, error model and error control codes so that the efficient reliable logic circuits can be obtained. We propose that single fault masking capability of a random logic circuit can be obtained by encoding its outputs in a byte error correcting code; this is equivalent to that of the triple module redundancy (TMR) technique. Similarly, byte error detecting code can be used to provide an equivalence of duplication. In this paper, we address the problems and issues related to the realization of byte-organized configuration where the byte error control codes can be applied. Some MCNC benchmark circuits are used as examples to demonstrate the feasibility of the proposed concept
Keywords
circuit reliability; error correction codes; logic circuits; logic design; byte error control code; error model; random logic circuit synthesis; reliability; single fault masking; Adders; Circuit faults; Circuit synthesis; Computer errors; Error correction; Error correction codes; Fault detection; Fault tolerance; Hardware; Logic circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Conference_Location
Boston, MA
ISSN
1550-5774
Print_ISBN
0-8186-7545-4
Type
conf
DOI
10.1109/DFTVS.1996.572035
Filename
572035
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