• DocumentCode
    2610899
  • Title

    Process disturbance identification using ICA-based image reconstruction scheme with neural network

  • Author

    Huang, Shien-Ping ; Chiu, Chih-Chou ; Cook, Deborah F. ; Lu, Chi-jie

  • Author_Institution
    Taipei Coll. of Maritime Technol., Taipei
  • fYear
    2007
  • fDate
    2-4 Dec. 2007
  • Firstpage
    1103
  • Lastpage
    1109
  • Abstract
    Process monitoring and control of a production line are often used in industry to maintain high-quality production and to facilitate high levels of efficiency in the process. However, current process control techniques, such as statistical process control (SPC) and engineering process control (EPC), may not effectively detect abnormalities, especially when autocorrelation is present in the process. This paper proposes an independent component analysis (ICA)-based image reconstruction scheme with a neural network approach to identify disturbances and recognize shifts in the correlated process parameters. The resulting image can effectively remove the textual pattern and preserve disturbances distinctly. We illustrate our approach using two most commonly encountered disturbances, the step-change disturbance and the linear disturbance, in a manufacturing process. The experimental results reveal that the proposed method is effective and efficient for disturbance identification in correlated process parameters when disturbance is significant. Additionally, the identification rate made by the proposed method is slightly influenced by the data correlation.
  • Keywords
    image reconstruction; independent component analysis; manufacturing data processing; neural nets; process control; process monitoring; correlated process parameter; data correlation; image reconstruction; independent component analysis; manufacturing process disturbance identification; neural network; process control; process monitoring; production line control; textual pattern; Autocorrelation; Image recognition; Image reconstruction; Independent component analysis; Industrial control; Maintenance engineering; Monitoring; Neural networks; Process control; Production; EPC; ICA; SPC; neural networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2007 IEEE International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1529-8
  • Electronic_ISBN
    978-1-4244-1529-8
  • Type

    conf

  • DOI
    10.1109/IEEM.2007.4419363
  • Filename
    4419363