DocumentCode

2612112

Title

Rapid Assessment of the Humidity Dependence of IC Failure Modes by Use of HAST

Author

Gunn, Jeffrey E. ; Camenga, Robert E. ; Malik, Sushil K.

Author_Institution

International Business Machines Corporation, Dept. A45, Bldg. 052, P. O. Box 390, Poughkeepsie, New York 12602

fYear

1983

fDate

30407

Firstpage

66

Lastpage

72

Keywords

Acceleration; Atmosphere; Humidity; Kinetic theory; Life estimation; Moisture; Temperature dependence; Testing; Thermal force; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 1983. 21st Annual

Conference_Location

Phoenix, AZ, USA

ISSN

0735-0791

Type

conf

DOI

10.1109/IRPS.1983.361963

Filename

4208484