DocumentCode
2612708
Title
Objectives and results of the PEP´87 round-robin calibration of reference solar cells and modules
Author
Metzdorf, J. ; Wittchen, T. ; Heidler, K. ; Dehne, K. ; Shimokawa, R. ; Nagamine, F. ; Ossenbrink, H. ; Fornarini, L. ; Goodbody, C. ; Davies, M. ; Emery, K. ; DeBlasio, R.
fYear
1990
fDate
21-25 May 1990
Firstpage
952
Abstract
An international comparison of calibrations of reference solar cells and PV (photovoltaic) modules was carried out in 1987 to 1989. Results of comprehensive measurements performed on eight reference cells in a single-cell package, six reference cells in a multicell package, and six PV modules are presented. Amorphous Si, monocrystalline Si, and multicrystalline Si technologies were included in the round robin. A pyranometer circulated with the reference cells allowed pyranometer calibration uncertainties to be evaluated. As the standardization of calibration methods and reference devices is desired by the International Electrotechnical Commission, this comparison examined whether the many primary calibration methods evaluated were accurate enough and suitable for wide use. The effects of the definition and packaging of primary reference devices on the achievable uncertainties of the calibration in the chain from cell to module are discussed. The following achievable minimum uncertainties are considered to be realistic and are recommended for primary calibrations: U 95=±2% with random error of ±1%
Keywords
atmospheric measuring apparatus; calibration; semiconductor device testing; solar cell arrays; solar cells; standardisation; IEC; PV; Si; accuracy; calibration; measurements; pyranometer; reference solar cells; semiconductor derive testing; standardization; Amorphous materials; Calibration; Packaging; Performance evaluation; Photovoltaic cells; Photovoltaic systems; Round robin; Solar power generation; Standardization; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1990., Conference Record of the Twenty First IEEE
Conference_Location
Kissimmee, FL
Type
conf
DOI
10.1109/PVSC.1990.111759
Filename
111759
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