DocumentCode
2614435
Title
The Distribution of Electromigration Failures
Author
LaCombe, Donald J. ; Parks, Earl L.
Author_Institution
Electronics Laboratory, General Electric Company, P.O. Box 4840, Syracuse, New York 13221
fYear
1986
fDate
31503
Firstpage
1
Lastpage
6
Abstract
This paper presents the results of an evaluation of the statistical distribution of electromigration test failures. Large scale life tests were carried out and the natujre of the failure distributions were determined for lines of varying length and width. In all cases, the distribution were found to be log-normal down to at least the 0.3% failure point. Possible reasons for these results and their implications with regard to the design of a cost effective electromigration testing program are discussed.
Keywords
Computer simulation; Costs; Electromigration; Extrapolation; Grain size; Laboratories; Large-scale systems; Life testing; Lifting equipment; Statistical distributions;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1986. 24th Annual
Conference_Location
Anaheim, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1986.362103
Filename
4208633
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