• DocumentCode
    2615404
  • Title

    Statistical simulation of chip multiprocessors running multi-program workloads

  • Author

    Genbrugge, Davy ; Eeckhout, Lieven

  • Author_Institution
    ELIS Dept., Ghent Univ., Ghent
  • fYear
    2007
  • fDate
    7-10 Oct. 2007
  • Firstpage
    464
  • Lastpage
    471
  • Abstract
    This paper explores statistical simulation as a fast simulation technique for driving chip multiprocessor (CMP) design space exploration. The idea of statistical simulation is to measure a number of important program execution characteristics, generate a synthetic trace, and simulate that synthetic trace. The important benefit is that a synthetic trace is very small compared to real program traces. This paper advances statistical simulation by modeling shared resources, such as shared caches and off-chip bandwidth. This is done (i) by collecting cache set access probabilities and per-set LRU stack depth profiles, and (ii) by modeling a programpsilas time-varying execution behavior in the synthetic trace. The key benefit is that the statistical profile is independent of a given cache configuration and the amount of multiprocessing, which enables statistical simulation to model conflict behavior in shared caches when multiple programs are co-executing on a CMP. We demonstrate that statistical simulation is both accurate and fast with average IPC prediction errors of less than 5.5% and simulation speedups of 40X to 70X compared to the detailed simulation of 100M-instruction traces. This makes statistical simulation a viable tool for CMP design space exploration.
  • Keywords
    cache storage; digital simulation; logic design; logic simulation; microprocessor chips; statistical analysis; cache configuration; chip multiprocessors; design space exploration; multi-program workloads; program execution characteristics; statistical simulation; time-varying execution behavior; Bandwidth; Character generation; Computational modeling; Computer simulation; Predictive models; Probability; Process design; Semiconductor device measurement; Space exploration; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2007. ICCD 2007. 25th International Conference on
  • Conference_Location
    Lake Tahoe, CA
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4244-1257-0
  • Electronic_ISBN
    1063-6404
  • Type

    conf

  • DOI
    10.1109/ICCD.2007.4601940
  • Filename
    4601940