DocumentCode
2615429
Title
Computer Guided Logic IC Fault Location
Author
Rauwerdink, Jeffrey L.
Author_Institution
Harris Semiconductor, Custom Integrated Circuits Division, P. O. Box 883, MI/S 52-010, Melbourne, FL 32901. Tel. (305) 729-5833
fYear
1987
fDate
31868
Firstpage
107
Lastpage
110
Abstract
A new technique locates `stuck´ faults in semicustom logic ICs (integrated circuits) using a PC (printed circuit) board functional tester which has a guided-probe fault location capability. The IC CAD (computer aided design) database, database translator programs and a logic simulator are utilized to automate the fault site location process This technique is in use on a set of 15 gate arrays.
Keywords
Circuit faults; Circuit testing; Databases; Design automation; Fault location; Integrated circuit testing; Logic circuits; Logic testing; Printed circuits; Programmable logic arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1987. 25th Annual
Conference_Location
San Diego, CA, USA
ISSN
0735-0791
Type
conf
DOI
10.1109/IRPS.1987.362164
Filename
4208698
Link To Document