Reliable quadric relationship of frequency turn-over temperature characteristics vs. electrode film thicknesses for quartz crystal tuning forks

Author

NAKAZAWA, Mitsuo ; Yamamoto, Masahiro ; Satoh, Kazutaka ; Mori, Takayuki ; Itoh, Hideaki

Author_Institution

Shinshu Univ., Nagano, Japan

fYear

1997

fDate

28-30 May 1997

Firstpage

722

Lastpage

730

Abstract

A reliable quadric formula for frequency turn-over temperature vs. electrode film thickness in the quartz crystal tuning fork is proposed and the coefficients are experimentally determined by the least squares method. Reliable experiments with respect to frequency temperature characteristics for quartz crystal tuning forks are carried out. In particular, a new analysis for the Young´s modulus of the electrode film is also described, and it is expected to be valuable to film technology

Keywords

Young´s modulus; crystal resonators; electrodes; least squares approximations; tuning; SiO₂; Young modulus; coefficients; electrode film thicknesses; frequency turn-over temperature characteristics; least squares method; quartz crystal tuning forks; reliable quadric relationship; Crystallography; Electrodes; Equations; Frequency; Least squares methods; Magnetooptic recording; Optical films; Optical tuning; Temperature; Vibrations;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1997., Proceedings of the 1997 IEEE International

Conference_Location

Orlando, FL

Print_ISBN

0-7803-3728-X

Type

conf

DOI

10.1109/FREQ.1997.638773

Filename

638773