DocumentCode
2621430
Title
Determining a maximum value yield of a log using an optical log scanner
Author
Lee, Samuel C. ; Qian, Gen-Sheng ; Chen, Jan-Bon ; Sun, Yi-Wei ; Hay, Douglas A.
Author_Institution
Oklahoma Univ., Norman, OK, USA
fYear
1991
fDate
3-6 Jun 1991
Firstpage
747
Lastpage
748
Abstract
Two pattern recognition algorithms are proposed to detect two types of knots in lumber, lumped and surface knots, using an optical scanner. It is shown that lumped knots can be recognized by a log profile approach and surface knots can be detected by an image processing approach. A mathematical model for describing the geometry of the knots inside the log based on the surface parameters of the knots is presented. By a log breakdown strategy, the log can be cut into a maximum number of boards with prescribed dimensionalities. The mathematical knot model can be used to predict the locations, sizes, orientations, and shapes of the knots on these boards, whereby their lumber grades can be determined. Summing up the value yields of all the boards gives the value yield of the log. By computing all the possible value yields of the log from different log orientations, one can determine a maximum value yield of a log
Keywords
computerised pattern recognition; computerised picture processing; wood processing; image processing; knots; log breakdown strategy; log profile approach; lumber grades; lumped knots; mathematical knot model; maximum value yield; optical log scanner; pattern recognition algorithms; surface parameters; value yields; Computer vision; Economic forecasting; Electric breakdown; Face detection; Mathematical model; Pattern recognition; Sawing; Shape measurement; Sun; Wood industry;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 1991. Proceedings CVPR '91., IEEE Computer Society Conference on
Conference_Location
Maui, HI
ISSN
1063-6919
Print_ISBN
0-8186-2148-6
Type
conf
DOI
10.1109/CVPR.1991.139811
Filename
139811
Link To Document