• DocumentCode
    2621918
  • Title

    Overdamped Josephson junctions for applications to precision measurement

  • Author

    Lacquaniti, V. ; Andreone, D. ; Fretto, M. ; Leo, N. De ; Maggi, S. ; Francone, F. ; Rocci, R. ; Serazio, D. ; Sosso, A.

  • Author_Institution
    Ist. Nazionale di Ricerca Metrol., Torino
  • fYear
    2007
  • fDate
    26-27 June 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Overdamped Nb/Al-AlOx/Nb Josephson junctions are an intermediate state between the SIS and SNS Josephson junctions. With a proper choice of the fabrication parameters, stable and reproducible nonhysteretic current-voltage characteristics have been obtained Featuring critical current densities up to 70 kA/cm2 and characteristic voltages up to 450 muV at 4.2 K, overdamped junctions are suitable for many applications ranging from RSFQ electronic circuits to programmable and ac voltage standards. Tests on single junctions and arrays of series-connected junctions have shown a suitable behaviour when driven by a microwave with frequencies around 75 GHz. The quantized steps have proven to be stable and flat at nV level. These junctions have also shown an improved temperature dependence, which can be interesting in view of the development instrumentation with an integrated quantum voltage reference operated in a closed cycle refrigerator.
  • Keywords
    current density; refrigerators; superconducting junction devices; RSFQ electronic circuits; ac voltage standards; closed cycle refrigerator; current densities; fabrication parameters; integrated quantum voltage reference; nonhysteretic current-voltage characteristics; overdamped Josephson junctions; precision measurement; Circuit testing; Critical current density; Current-voltage characteristics; Electronic circuits; Fabrication; Frequency; Josephson junctions; Microwave antenna arrays; Niobium; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Sensors and Interface, 2007. IWASI 2007. 2nd International Workshop on
  • Conference_Location
    Bari
  • Print_ISBN
    978-1-4244-1245-7
  • Electronic_ISBN
    978-1-4244-1245-7
  • Type

    conf

  • DOI
    10.1109/IWASI.2007.4420046
  • Filename
    4420046