• DocumentCode
    2623019
  • Title

    Substrate coupling noise issues in silicon technology

  • Author

    Jenkins, Keith A.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2004
  • fDate
    8-10 Sept. 2004
  • Firstpage
    91
  • Lastpage
    94
  • Abstract
    Several factors are combining to increase concern about substrate coupling noise, or crosstalk, in silicon integrated circuits: there is a growing use of analog and mixed signal circuits in semiconductor products, there is greater integration density, and circuit frequencies are steadily increasing. Although the basic principles of electrical signal conduction through a semiconducting substrate are well understood, there is still a relatively poor understanding of the practical aspects of substrate-coupled noise: how important is substrate crosstalk in real applications? How good are the design guidelines for reducing crosstalk, or are accurate substrate modeling and simulation tools a necessity? What technology features can be used to reduce the coupling? This paper reviews progress in answering these questions.
  • Keywords
    crosstalk; semiconductor device noise; silicon; substrates; silicon integrated circuits; substrate coupling noise; substrate crosstalk; Analog integrated circuits; Coupling circuits; Crosstalk; Frequency; Integrated circuit noise; Integrated circuit technology; Semiconductivity; Semiconductor device noise; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Monolithic Integrated Circuits in RF Systems, 2004. Digest of Papers. 2004 Topical Meeting on
  • Print_ISBN
    0-7803-8703-1
  • Type

    conf

  • DOI
    10.1109/SMIC.2004.1398175
  • Filename
    1398175