DocumentCode
262427
Title
21.8 A pulling mitigation technique for direct-conversion transmitters
Author
Mirzaei, Abdolreza ; Mikhemar, Mohyee ; Darabi, Hooman
Author_Institution
Broadcom, Irvine, CA, USA
fYear
2014
fDate
9-13 Feb. 2014
Firstpage
374
Lastpage
375
Abstract
Despite versatility and low power consumption, direct-conversion transmitters suffer from a fundamental drawback: the local oscillator disturbance by the power amplifier, through unwanted electromagnetic or capacitive coupling [1,2]. As shown in Fig. 21.8.1, the pulled oscillator spectrum is no longer a single-tone sinusoid, which can drastically degrade the transmitter EVM or spectrum mask. To alleviate this, time-consuming and often unpredictable optimization of the floor plan, package, and PCB is required to maximize the isolation between the PA and VCO. Ultimately, this issue may prohibit the use of this architecture for many applications, leading to higher power consumption. Moreover, in many modern radios it is common to have more than one VCO on-chip (Fig. 21.8.1) to support various features such as FDD, carrier aggregation, or coexistence, further exacerbating the problem through multiple-VCO cross-coupling. To address these concerns we propose a calibration scheme that corrects any pulling effect regardless of its source or magnitude. Our approach is fully digital and is automatically calibrated, leading to a reliable and robust solution, and has little impact on power consumption, size, or transmitter noise.
Keywords
calibration; phase locked loops; radio transmitters; voltage-controlled oscillators; PLL; VCO; automatically calibrated approach; calibration scheme; direct-conversion transmitters; fully digital approach; power consumption; pulling mitigation technique; size; transmitter noise; Amplitude modulation; Baseband; Calibration; Frequency modulation; Phase locked loops; Transmitters; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
978-1-4799-0918-6
Type
conf
DOI
10.1109/ISSCC.2014.6757476
Filename
6757476
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