• DocumentCode
    262427
  • Title

    21.8 A pulling mitigation technique for direct-conversion transmitters

  • Author

    Mirzaei, Abdolreza ; Mikhemar, Mohyee ; Darabi, Hooman

  • Author_Institution
    Broadcom, Irvine, CA, USA
  • fYear
    2014
  • fDate
    9-13 Feb. 2014
  • Firstpage
    374
  • Lastpage
    375
  • Abstract
    Despite versatility and low power consumption, direct-conversion transmitters suffer from a fundamental drawback: the local oscillator disturbance by the power amplifier, through unwanted electromagnetic or capacitive coupling [1,2]. As shown in Fig. 21.8.1, the pulled oscillator spectrum is no longer a single-tone sinusoid, which can drastically degrade the transmitter EVM or spectrum mask. To alleviate this, time-consuming and often unpredictable optimization of the floor plan, package, and PCB is required to maximize the isolation between the PA and VCO. Ultimately, this issue may prohibit the use of this architecture for many applications, leading to higher power consumption. Moreover, in many modern radios it is common to have more than one VCO on-chip (Fig. 21.8.1) to support various features such as FDD, carrier aggregation, or coexistence, further exacerbating the problem through multiple-VCO cross-coupling. To address these concerns we propose a calibration scheme that corrects any pulling effect regardless of its source or magnitude. Our approach is fully digital and is automatically calibrated, leading to a reliable and robust solution, and has little impact on power consumption, size, or transmitter noise.
  • Keywords
    calibration; phase locked loops; radio transmitters; voltage-controlled oscillators; PLL; VCO; automatically calibrated approach; calibration scheme; direct-conversion transmitters; fully digital approach; power consumption; pulling mitigation technique; size; transmitter noise; Amplitude modulation; Baseband; Calibration; Frequency modulation; Phase locked loops; Transmitters; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4799-0918-6
  • Type

    conf

  • DOI
    10.1109/ISSCC.2014.6757476
  • Filename
    6757476