• DocumentCode
    262587
  • Title

    EP2: Anatomy of innovation: Bug or feature?

  • Author

    Lee, Harry ; Nishimura, Ken ; Lee, Harry

  • Author_Institution
    MIT, Cambridge, MA
  • fYear
    2014
  • fDate
    9-13 Feb. 2014
  • Firstpage
    526
  • Lastpage
    526
  • Abstract
    As process scaling slows down, circuit innovation is becoming one of the most important differentiators. We can point to great inventions of the past that were accidental, or failed attempts to solve other problems (bugs), as well as those from logical thinking (features). Which is more effective? In this panel, top analog circuit innovators describe the process by which their best innovations were conceived. They give interesting examples, such as turning a bug in the circuit into a feature. Then they argue whether innovation is more effective as a result of accidental discovery or logical thinking.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2014 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4799-0918-6
  • Type

    conf

  • DOI
    10.1109/ISSCC.2014.6757534
  • Filename
    6757534
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=262587