DocumentCode
2628084
Title
Statistical features selection from intrinsic mode functions for pathologies detection in retina digital images
Author
Lahmiri, Salim ; Gargour, Christian ; Gabrea, Marcel
Author_Institution
Dept. of Electr. Eng., Ecole de Technol. Supreireure, Montreal, QC, Canada
fYear
2012
fDate
25-28 Oct. 2012
Firstpage
1585
Lastpage
1590
Abstract
The empirical mode decomposition (EMD) is employed to analyze retina digital images in the frequency domain and statistical features are extracted from high frequency components of the analyzed images. The purpose is to classify normal versus abnormal images. Three different pathologies are considered including, circinates, drusens, and microaneurysms (MA). The most informative and non redundant features are ranked and selected by use of statistical features selection techniques; namely t-statistic, entropy, Battacharrayia statistic, the area between the receiver operating characteristic (ROC) and principal component analysis (PCA). Finally, support vector machines (SVM) with polynomial and radial basis function (RBF) kernels are used to classify retina digital images based on the selected features. The simulation results from leave-one-out method (LOOM) show the effectiveness of the EMD-Battacharrayia-SVM achieves 96.54%±0.0293 correct classification rate. Thus, features selection helps improving the accuracy of our system designed for pathologies detection in retina.
Keywords
biomedical optical imaging; entropy; eye; feature extraction; frequency-domain analysis; image classification; medical image processing; principal component analysis; radial basis function networks; sensitivity analysis; support vector machines; Battacharrayia statistic; PCA; ROC; SVM; circinates; drusens; empirical mode decomposition; entropy; frequency domain; high frequency components; image classification; intrinsic mode functions; leave-one-out method; microaneurysms; optical imaging; pathologies detection; polynomial basis function kernels; principal component analysis; radial basis function kernels; receiver operating characteristic; retina digital image analysis; statistical feature extraction; statistical features selection; support vector machines; t-statistics; Accuracy; Discrete wavelet transforms; Entropy; Retina; Support vector machines;
fLanguage
English
Publisher
ieee
Conference_Titel
IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
Conference_Location
Montreal, QC
ISSN
1553-572X
Print_ISBN
978-1-4673-2419-9
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2012.6388532
Filename
6388532
Link To Document