• DocumentCode
    2628084
  • Title

    Statistical features selection from intrinsic mode functions for pathologies detection in retina digital images

  • Author

    Lahmiri, Salim ; Gargour, Christian ; Gabrea, Marcel

  • Author_Institution
    Dept. of Electr. Eng., Ecole de Technol. Supreireure, Montreal, QC, Canada
  • fYear
    2012
  • fDate
    25-28 Oct. 2012
  • Firstpage
    1585
  • Lastpage
    1590
  • Abstract
    The empirical mode decomposition (EMD) is employed to analyze retina digital images in the frequency domain and statistical features are extracted from high frequency components of the analyzed images. The purpose is to classify normal versus abnormal images. Three different pathologies are considered including, circinates, drusens, and microaneurysms (MA). The most informative and non redundant features are ranked and selected by use of statistical features selection techniques; namely t-statistic, entropy, Battacharrayia statistic, the area between the receiver operating characteristic (ROC) and principal component analysis (PCA). Finally, support vector machines (SVM) with polynomial and radial basis function (RBF) kernels are used to classify retina digital images based on the selected features. The simulation results from leave-one-out method (LOOM) show the effectiveness of the EMD-Battacharrayia-SVM achieves 96.54%±0.0293 correct classification rate. Thus, features selection helps improving the accuracy of our system designed for pathologies detection in retina.
  • Keywords
    biomedical optical imaging; entropy; eye; feature extraction; frequency-domain analysis; image classification; medical image processing; principal component analysis; radial basis function networks; sensitivity analysis; support vector machines; Battacharrayia statistic; PCA; ROC; SVM; circinates; drusens; empirical mode decomposition; entropy; frequency domain; high frequency components; image classification; intrinsic mode functions; leave-one-out method; microaneurysms; optical imaging; pathologies detection; polynomial basis function kernels; principal component analysis; radial basis function kernels; receiver operating characteristic; retina digital image analysis; statistical feature extraction; statistical features selection; support vector machines; t-statistics; Accuracy; Discrete wavelet transforms; Entropy; Retina; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society
  • Conference_Location
    Montreal, QC
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4673-2419-9
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2012.6388532
  • Filename
    6388532