A Watchdog Sensor for Assuring the Quality of Various Perishables with Subthreshold CMOS Circuits

Author

Ueno, Ken ; Hirose, Tetsuya ; Asai, Tetsuya ; Amemiya, Yoshihito

Author_Institution

Dept. of Electr. Eng., Hokkaido Univ.

fYear

0

fDate

0-0 0

Firstpage

156

Lastpage

157

Abstract

We developed a CMOS integrated-circuit sensor that emulates the change in quality of various perishables. This sensor is attached to perishable goods such as farm and marine products and is carried from producers to consumers along with the goods. During their distribution process, the sensor experiences the surrounding temperature and emulates the deterioration of the goods caused by the surrounding temperatures. By reading the output of the sensor, consumers can determine whether the goods are fresh or not. This sensor consists of subthreshold CMOS circuits with a low-power consumption of 5muW or less

Keywords

CMOS integrated circuits; food products; low-power electronics; quality assurance; sensors; 5 muW; CMOS integrated-circuit sensor; low power consumption; perishable goods; quality assurance; subthreshold CMOS circuits; watchdog sensor; Artificial intelligence; CMOS process; Chemical elements; Chemical sensors; Digital circuits; Intelligent sensors; MOSFET circuits; Subthreshold current; Temperature distribution; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits, 2006. Digest of Technical Papers. 2006 Symposium on

Conference_Location

Honolulu, HI

Print_ISBN

1-4244-0006-6

Type

conf

DOI

10.1109/VLSIC.2006.1705357

Filename

1705357