• DocumentCode
    2628947
  • Title

    Removal of Eye Blink Artifacts From EEG Signals Based on Cross-Correlation

  • Author

    Yoo, Kil-Sang ; Basa, Tristan ; Lee, Won-Hyung

  • Author_Institution
    Chung-Ang Univ., Seoul
  • fYear
    2007
  • fDate
    21-23 Nov. 2007
  • Firstpage
    2005
  • Lastpage
    2014
  • Abstract
    Artifacts such as eye blinks cause interference signals within electroencephalogram (EEG) measurements. Therefore, we propose a method for artifact removal based on certain power spectrum features of independent components extracted from the EEGs by fusing ensemble average and cross-corrasion parameter. First, each independent component which was assumed to be a source was searched by applying cross-corrasion parameter to EEG which involved artifacts relevant to the eye blinks of a normal person. Next, the signal which was assumed to be blink artifacts can be removed using high-pass filtering. The removal results of the eye blink artifacts are fed into the interpretation system.
  • Keywords
    electroencephalography; high-pass filters; medical signal processing; EEG signals; electroencephalogram measurements; eye blink artifacts removal; high-pass filtering; interpretation system; Data analysis; Electrodes; Electroencephalography; Electrooculography; Enterprise resource planning; Independent component analysis; Pollution measurement; Scalp; Signal generators; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Convergence Information Technology, 2007. International Conference on
  • Conference_Location
    Gyeongju
  • Print_ISBN
    0-7695-3038-9
  • Type

    conf

  • DOI
    10.1109/ICCIT.2007.187
  • Filename
    4420546