• DocumentCode
    2630155
  • Title

    Development of radiation detectors based on semi-insulating silicon carbide

  • Author

    Ruddy, Frank H. ; Seidel, John G. ; Flammang, Robert W. ; Singh, Ranbir ; Schroeder, John

  • Author_Institution
    Westinghouse Electric Co. Science and Technology Department, 1332 Beulah Road, Pittsburgh, PA 15235-5081 USA
  • fYear
    2008
  • fDate
    19-25 Oct. 2008
  • Firstpage
    449
  • Lastpage
    455
  • Abstract
    Fast-neutron detectors based on high-purity semi-insulating 4H silicon carbide (SiC) semiconductor have been fabricated and tested. The response characteristics of these detectors have been compared with those of epitaxial 4H-SiC Schottky diode detectors. The charge collection efficiency has been tested using alpha particles and the fast-neutron response has been tested with 14-MeV and 2.5-MeV neutrons. Over the applied voltage range tested, the charge collection efficiency for alpha particles is generally lower for the semi-insulating SiC detectors, and the fast-neutron detection efficiencies are also lower. Both the lower charge collection efficiency and the lower fast-neutron detection efficiencies are primarily caused by charge recombination in combination with the low electric fields across the thicker semi-insulating SiC detectors and the inability of the detector packaging to adequately withstand high voltages. Semiinsulating SiC detectors provide a viable alternative to epitaxial SiC diode detectors for fast-neutron detection and methods to improve the performance of semi-insulating SiC detectors are proposed.
  • Keywords
    Alpha particles; Envelope detectors; Neutrons; Packaging; Radiation detectors; Radiative recombination; Schottky diodes; Semiconductor device testing; Silicon carbide; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2008. NSS '08. IEEE
  • Conference_Location
    Dresden, Germany
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-2714-7
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2008.4775205
  • Filename
    4775205