• DocumentCode
    2631960
  • Title

    Document image defect models and their uses

  • Author

    Baird, Henry S.

  • Author_Institution
    AT&T Bell Lab., Murray Hill, NJ, USA
  • fYear
    1993
  • fDate
    20-22 Oct 1993
  • Firstpage
    62
  • Lastpage
    67
  • Abstract
    The accuracy of today´s document recognition algorithms falls abruptly when image quality degrades even slightly. In an effort to surmount this barrier, researchers have in recent years intensified their study of explicit, quantitative, parameterized models of the image defects that occur during printing and scanning. The author reviews the recent literature and discusses the form these models might take. A preview of a large public-domain database of character images, labeled with ground-truth including all defect model parameters, is given. The use of massive pseudo-randomly generated training sets for the construction of high-performance decision trees for preclassification is described. In a more theoretical vein, the author reports preliminary results in the estimation of the intrinsic error of precisely-specified text recognition problems. Finally, the author calls attention to some open problems
  • Keywords
    document image processing; model-based reasoning; optical character recognition; visual databases; accuracy; character images; defect model parameters; document image defect models; document recognition algorithms; explicit; ground truth labelling; high-performance decision trees; image quality degradation; intrinsic error estimation; parameterized models; precisely-specified text recognition problems; preclassification; printing; pseudo-randomly generated training sets; public-domain database; quantitative; scanning; Clustering algorithms; Degradation; Hardware; Image quality; Image recognition; Ink; NIST; Physics; Pixel; Printing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Document Analysis and Recognition, 1993., Proceedings of the Second International Conference on
  • Conference_Location
    Tsukuba Science City
  • Print_ISBN
    0-8186-4960-7
  • Type

    conf

  • DOI
    10.1109/ICDAR.1993.395781
  • Filename
    395781