• DocumentCode
    2635361
  • Title

    Effects of Embedded Decompression and Compaction Architectures on Side-Channel Attack Resistance

  • Author

    Liu, Chunsheng ; Huang, Yu

  • Author_Institution
    Comput. & Electron. Eng., Nebraska Univ.-Lincoln, Omaha, NE
  • fYear
    2007
  • fDate
    6-10 May 2007
  • Firstpage
    461
  • Lastpage
    468
  • Abstract
    Attack resistance has been a critical concern for security-related applications. Various side-channel attacks can he launched to retrieve security information such as encryption key. Prior work does not consider the presence of embedded compression architectures and their impacts on security. This paper analyzes the complexity of side-channel attacking on designs with embedded decompression and compaction circuit. A possible attacking strategy was first presented and performs analysis on the complexity of attacking circuits with EDT architecture. The probabilistic analysis was then extended to the more general compaction schemes using distance coding. The authors have shown that successful attacking of designs with embedded decompressor and compactor is extremely difficult. The complexity is much higher than the results shown in prior work assuming no decompression and compaction. It indicates that the use of embedded compression architectures can achieve higher security level.
  • Keywords
    automatic testing; cryptography; embedded systems; logic testing; attacking strategy; compaction circuit; distance coding; embedded compression architectures; embedded decompression; embedded deterministic testing; probabilistic analysis; security-related applications; side-channel attack resistance; Circuit testing; Compaction; Controllability; Cryptography; Hardware; Information retrieval; Information security; Logic testing; Observability; Protection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2007. 25th IEEE
  • Conference_Location
    Berkeley, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-2812-0
  • Type

    conf

  • DOI
    10.1109/VTS.2007.29
  • Filename
    4209954